Abstract
Nanostructured Zn(Cu)O in different morphologies were prepared by simple thermal decomposition of respective acetate precursors in three different processing temperatures (350 °C, 550 °C and 750 °C) and characterized using various techniques. Further, the X-ray excited photocurrent studies were carried out for all the three sample′s thick films coated on the top of patterned interdigitated electrode. This measurement was carried out at room temperature under the illumination of X-ray at 3.2 s using an intra-oral X-ray machine. The measured electrical current was applied to calculate percentage of X-ray sensitivity for nanostructured Zn(Cu)O samples obtained at 350 °C, 550 °C and 750 °C were found to be 1.43, 1.04 and 0.69 nC mGy−1 cm−3 respectively. These obtained experimental findings explore the role of crystallite size on low-dose X-ray sensing nature of nanostructured Zn(Cu)O. A suitable mechanism was proposed to explain the sensing nature of nanostructured Zn(Cu)O.
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