Abstract
Nanocomposite thick films of PbI2: PVDF-HFP and CsPbI3: PVDF-HFP were coated on the top of interdigitated electrodes and studied for their low-dose X-ray sensing behaviour. The X-ray sensing measurement was performed for different exposure durations at room temperature up to 3.2 s using an intra-oral AC X-ray machine. The difference in the measured photocurrent under the illumination of pulsed X-ray was recorded using a Keithley 2450 source meter interfaced with dedicated computer. Prior to the sensing measurement, the pristine polycrystalline samples and thick films were studied for structural, microstructural and optical properties respectively, using a powder X-ray diffraction, scanning electron microscope, Raman and diffuse reflectance spectrophotometers. The observed results reveal that all samples are single phase without any other impurities in the form of a uniform thick dense film with crystallites in rod morphology (2 μm length and 200 nm diameter). An appreciable sensitivity of CsPbI3: PVDF-HFP thick film for a different dose durations as compared with PbI2: PVDF-HFP thick film explores the possibility of using it for low dose X-ray sensor development.
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