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Abstract
We have investigated the local structure of CuInSe2 (CIS) thin films by surface-sensitive EXAFS on the Cu K- and Se K-edges using synchrotron radiation. We estimated the Cu–Se and In–Se bond lengths as a function of In/Cu ratio. The local structure of the thin film CIS is quite similar to that of the bulk chalcopyrite over a wide range of the In/Cu ratio. It is found that with decreasing the In/Cu ratio from the stoichiometric composition, the Cu–Se and In–Se bond lengths systematically deviate from those of stoichiometric bulk CuInSe2, which is attributed to the chemical disorder of the cation site in the chalcopyrite structure.
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