Abstract
An epitaxial La0.8Ca0.2MnO3/LaAlO3 (LCMO/LAO) thin film was fabricated using the pulsed laser deposition (PLD) technique to evaluate the magnetoresistance (MR) and temperature coefficient of resistance (TCR). The LCMO film was about 200nm in thickness and appeared to have a strong out-of-plane texture. A giant value of MR 73% and 57% for both the ab-plane and in the c-directions respectively are obtained at 1.5T applied field. The values of TCR are about 14.2% K−1 and 11.5% K−1 for both the ab-plane and in the c-directions respectively in a wide temperature range. These results proved that La0.8Ca0.2MnO3/LaAlO3 (LCMO/LAO) thin film is a promising candidate of perovskites for novel electronic applications.
Published Version
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