Abstract
We have investigated the influence of microscopic surface structures of the MgO protective layer on the ion-induced secondary electron emission coefficient in alternating-current plasma display panels (AC-PDPs). The microscopic surface structures of the MgO protective layer have been formed by using a mesh mask with an electron beam evaporation method. The ion-induced secondary electron emission coefficient γ of the MgO protective layer with mesh-patterned microscopic surface structures has been measured by the γ-FIB (focused ion beam) system. It is found that the MgO protective layer with microscopic surface structures has a higher γ than those without any surface structures.
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