Abstract
We have investigated the influence of microscopic surface structures of the MgO protective layer on the ion-induced secondary electron emission coefficient in alternating-current plasma display panels (AC-PDPs). The microscopic surface structures of the MgO protective layer have been formed by using a mesh mask with an electron beam evaporation method. The ion-induced secondary electron emission coefficient γ of the MgO protective layer with mesh-patterned microscopic surface structures has been measured by the γ-FIB (focused ion beam) system. It is found that the MgO protective layer with microscopic surface structures has a higher γ than those without any surface structures.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.