Abstract
The paper deals with single-element fault detection for linear analogue circuits. The method proposed is based on the measurement of a set of node voltages for a circuit excited by one or more current sources. The measured values of these node voltages specify a point in m-dimensional vector space that is compared with the precomputed curves as defined by the parametric equations of the components in the network. The faulty component is located by the relative distance between the measured point and the curves. The subtree-sum method is used to calculate the symbolic network functions. The theoretical basis of the procedure is also discussed. An example is worked out in detail to demonstrate the feasibility of the procedure.
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