A method for multiple fault diagnosis in analog circuits

Abstract

Fault diagnosis of analog circuits is essential for analog and mixed-signal circuits testing and maintenance. A method for multiple fault diagnosis in linear analog circuits is proposed based on the large change sensitivity analysis and ambiguity group locating technique. A test equation establishes the relationship between the measured responses and deviations of faulty parameters. Multiple excitations and corresponding measurements are required for fault location. The parameter evaluation can provide the exact parameter solutions. The faulty parameter deviations can be between zero and infinity. The proposed method is extremely effective for the circuit with very limited accessible nodes and is also computationally efficient.