A method for multiple fault diagnosis in dynamic analogue circuits

Abstract

A method for multiple fault diagnosis in linear and nonlinear dynamic analogue circuits is developed in this paper. The method deals with soft faults and enables us to locate (identify) the faulty elements as well as evaluate their values (parameters). It exploits the transient and sensitivity analyses in the time domain and measurements in a test node. The method needs only two accessible test nodes. Two numerical examples illustrate the proposed approach and show its efficiency.