Abstract
In the near future electronic systems and circuits which are able to work at high temperatures will be used for sensor and actuator applications, especially where cooling is not possible or very difficult. A second reason for developing high temperature sensor systems is to avoid long signal ways between sensor and signal processing electronic in order to improve EMC-properties. Using thick film hybrid technology provides an easy way of constructing high temperature electronics. But normally thick film components are not specified for temperatures higher than 423 K. Our goal is to characterize and to optimize thick film components for a large temperature range. In order to get information about high temperature behaviour, it is necessary to use suitable testing techniques. This report will introduce some methods like linear test or step stress test which allow accelerated life tests in order to extract the temperature coefficient as well as the behaviour of degradation. In case of thick films, results for preselections can be easily obtained. Results of examined thick film resistors tested up to 773 K will be presented as an example.
Published Version
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