Abstract
The bias dependence of Channel Hot Carrier (CHC) degradation in 0.18μm SOI pMOSFETs is investigated in this paper. Two classical bias modes (V g @I submax and V g =V d ) were applied to analyze the CHC degradation behavior of SOI pMOSFETs. The results show that at low V g , hot carriers injection produced by impact ionization is the main factor contributed to degradation. However, the degradation stressed at high V g is controlled by both CHC and NBTI effect, showing the NBTI-like behavior at room temperature which indicates that NBTI effect is the dominant factor. A possible mechanism is put forward to explain the enhanced CHC degradation under V g =V d compared with pure NBTI degradation. The influence of floating body on the performance degradation of PDSOI devices is also investigated.
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