Abstract
Thin films of chalcogenide glasses deposited on quartz glass substrates by thermal evaporation in vacuum have been investigated. The dependences n(λ) and k(λ) for films of different composition have been determined from the transmission spectra. Expressions of the n = A + BL + CL 2 + Dλ 2 + Eλ 4 type (L = (λ 2 − 0.028)−1 and A, B, C, D, and E are constants) for calculating the refractive indices of As2Se3, AsSe4, AsS4, and AsS16.2Se16.2 films in the wavelength range from 0.5 to 2.5 μm are reported.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
