Abstract
Critical current is a key parameter for HTS tapes, which is able to determine the performance of superconducting devices. In this study, we chose two kinds of HTS tape, with magnetic and non-magnetic substrates, to experimentally investigate their critical current capability. The influence of different DC current ramp rates (R-value) on the critical current and n-value were evaluated in the experiments. The results indicated how current ramp rates influenced the V-I measurements of the given YBCO tapes. Magnetic field-dependent critical current characteristics played a crucial role in these measurements.
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