Abstract
Radial distribution functions of amorphous materials may be obtained using high energy electron diffraction and an analysis based on a single scattering approximation. Here we discuss the errors introduced by this analysis when it is applied to thick foils. It is found that interatomic spacings may still be determined with accuracy but coordination numbers will be in error. A method for retrieving single scattering intensity distributions from multiply scattered electrons is discussed and applied to data from hydrogenated amorphous silicon.
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