Abstract
The measurement of internal friction in solid materials is one of the most useful techniques for the investigation of lattice defects in solids. Such studies for metal films have been carried out by Weiss et al. 1 and Postnikov et al. 2,3 Measurement of the recovery of the electrical resistance is also a powerful tool for the investigation of the nature of structural defects, especially point defects 4,5. In the present work, we have measured above room temperature the electrical resistance and the internal friction of silver films deposited at room temperature. It has been found that the recovery processes at temperatures ranging from 80°C to 160°C are closely related to each other.
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