InNAsSb Single Crystals with Cutoff Wavelength of 11–13.5 µm Grown by Melt Epitaxy

Abstract

We grew, for the first time, InNAsSb single crystals with a room temperature cutoff wavelength of 11–13.5 µm on (100) InAs substrates by melt epitaxy (ME). The crystals were characterized using X-ray diffraction, electron-probe microanalysis (EPMA), temperature-dependent transmittance and Van der Pauw measurements. An obvious redshift of cutoff wavelength was observed with increasing N concentration from 13 to 19% in the epilayers. The cutoff wavelength varies from 12.5 to 8.9 µm in the temperature range from 300 to 77 K. The thick epilayers show a good macroscopic homogeneity of the composition. An electron mobility of 55,800 cm2/Vs with a carrier density of 1.08×1016 cm-3 was obtained at 77 K, indicating possible applications for infrared photodevices.