Abstract
Diffractive transmission x-ray optics, e.g., zone plates and gratings, are well suited for x-ray microscopy and spectroscopy. X-ray optics for use at short wavelengths require high zone aspect ratios which can be obtained by alternately depositing two materials with different x-ray scattering properties on a microwire. The roughness and the diffusion inherent to this process influence the diffraction efficiency of these optics. Using coupled wave theory, it is shown that roughness and interdiffusion increase the structure height required for optimal diffraction efficiency compared to ideally smooth structure profiles. In addition, the maximum obtainable diffraction efficiency decreases with increasing root-mean-square roughness and interdiffusion.
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