Influence of oval defects on transport properties in high-mobility two-dimensional electron gases

Abstract

Rare macroscopic growth defects next to a two-dimensional electron gas influence transport properties and cause a negative magnetoresistance. On the basis of this, we show that the number of oval defects seen on the material surface is comparable with the density of macroscopic growth defects determined from the negative magnetoresistance. We examine several materials with different densities of oval defects nS which were grown in one cycle under the same conditions to verify our observations. Paradoxically, the material with the largest number of oval defects has also the highest electron mobility.