Abstract
In this paper, a new two-dimensional analytical model for our proposed InAs/Si based double-gate dual-metal tunnel field-effect transistor (DG-TFET) with graphene nano-ribbon is presented. Incorporating group III-V material in source – channel junction, which in turn forms heterojunction results better device performance. Moreover, thin graphene nano-ribbon placed over intrinsic channel can tune the energy gap to larger extent, which supports better band-to-band (B2B) tunneling in our model. Direct tunneling model is used for Indium Arsenide (InAs), since it is direct bandgap material. Obtained Vth as 0.19 V, sub-threshold swing (SS) as 20.76 mV/decade and ION/IOFF ratio as 108 for the case of InAs/Si DG-TFET with graphene nano-ribbon shows an improvement of 48%, 36% and 10 decades respectively compared to conventional all-Si DG-TFET. Using 2-D TCAD numerical device simulator the proposed device model is designed and validated well with analytical data.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
