Abstract

In order to fabricate well-control led in situ SiC/C thermocouples embedded within macro-structural SiC components using an integrated selective area laser deposition (SALD) and the selective area laser deposition and vapor Infiltration (SALDVI) technique, the major processing parameters affecting the crystal structure, the deposition rate, surface morphology of deposits, and shapes and sizes of the cross section of deposited lines are evaluated. It is found that the growth rate of SiC deposits increases with temperature and tetramethy Isilane (TMS) gas pressure over the temperature and pressure range studied. The apparent activation energy for depositing SiC from TMS is 61 kJ/mole in the temperature range from 700 to 1200°C and independent of the TMS gas pressure ranging from 20 to 60 torr. The shape and size of the cross section of SiC lines depend strongly on the deposition temperature. XRD examination indicates that the deposition product using a C2H2 precursor at 900°C is crystalline graphite. The crytallinity of Si3N4 deposits is affected by the substrate material even though the deposition temperature and other process parameters are the same. These phenomena have been explained in terms of the growth controlling mechanisms of deposits, the temperature distribution induced by an incident laser beam, and the thermal conductivity of the substrate.

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