Abstract
This paper investigates the effect of the conduction band offset energy at the interface between the separate confinement layer (SCL) and the p-cladding on the temperature behavior of InGaAsP lasers emitting at 1.5 µm. The performance of a laser structure incorporating an additional In0.81Ga0.19P barrier at that interface is compared to that of a regular laser structure. The results are analyzed using a comprehensive simulation software. It is shown that the current leakage at the SCL-p-cladding interface is not the dominant current loss mechanism at room temperature. However, at a higher temperature an additional InGaP electron stopper layer can efficiently reduce the electron leakage current. Finally, our measurements show that above a critical temperature the absorption loss increases dramatically.
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