Improved Wavelet Thresholding for CCD Measurement Image Denoising

Abstract

An improved wavelet thresholding method is presented and successfully applied to CCD measuring image denoising. On the analysis of the current widely used soft threshold and hard threshold, combining characteristics of the CCD measuring image and use of local correlation of wavelet coefficients, an improved threshold function is proposed, and the denoising results were contrasted among different threshold functions. The simulation results show that adopting the improved threshold function can acquire better filtering effect than traditional soft threshold and hard threshold methods.