Impact of Process Variability and Single Event Transient on FinFET Technology

Leonardo H Brendler,Alexandra L Zimpeck,Ricardo Reis,Cristina Meinhardt

doi:10.1109/vlsi-soc.2019.8920355

Impact of Process Variability and Single Event Transient on FinFET Technology

Leonardo H Brendler, Alexandra L Zimpeck + Show 2 more

https://doi.org/10.1109/vlsi-soc.2019.8920355

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Publication Date: Oct 1, 2019

Citations: 6

Affiliation: Universidade Federal do Rio Grande do Sul, Universidade Federal de Santa Catarina

#Current Research Works #Impact Of Process Variability + Show 8 more

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Abstract

The evolution of integrated circuits has made them more susceptible to the radiation effects, besides increasing the manufacturing process variability. Traditionally, complex gates are adopted to reduce area, delay and power consumption. However, they can introduce challenges related to a robustness that might be avoided with more regular and basic cells. This extended abstract presents my current research works. Firstly, the different works performed in my research are described. Then, a short version methodology and the main results are presented.

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