Abstract
The evolution of integrated circuits has made them more susceptible to the radiation effects, besides increasing the manufacturing process variability. Traditionally, complex gates are adopted to reduce area, delay and power consumption. However, they can introduce challenges related to a robustness that might be avoided with more regular and basic cells. This extended abstract presents my current research works. Firstly, the different works performed in my research are described. Then, a short version methodology and the main results are presented.
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