Abstract
The impact of different electron transport layers (ETLs) based on fullerene derivatives, such as the well-known PC61BM and promising 3-pyridyl-substituted pyrrolidino[60]fullerene (PYF-30), on the electric field-induced degradation of inverted perovskite solar cells has been demonstrated. Devices assembled using PYF-30 and PC61BM deposited from deuterated chloroform exhibit significantly higher stability compared to PC61BM films deposited from chlorobenzene. The main reason for the decrease in the efficiency of the device during aging is the formation of pinhole-type defects in the ETL caused by the agglomeration of molecules of fullerene derivatives.
Published Version
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