Abstract
Ion Beam Induced Charge (IBIC) technique was used for imaging different properties of several radiation detectors. Small lateral dispersion of 3–5 MeV proton microbeam allowed us to investigate a scanned detector as an array of independent charge sensitive detectors. The detector response function at each point was separately analyzed. The mean and the median detected proton energy, as well as standard deviation, was calculated and connected to the local value of the detector collection efficiency and resolution. The progressive change (increase or decrease) of the collection efficiency with the time was studied. IBIC was also applied for imaging the incomplete charge collection layer in Si(Li) X-ray detectors.
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