Identifikasi Sumber Ketahanan Aksesi Plasma Nutfah Kedelai untuk Ulat Grayak Spodoptera litura F.

Abstract

<p>The important<br />aspect of development of resistant plant to insect pest is source<br />of resistance. Study the resistance of 14 advance soybean<br />breeding lines to common cutworm Spodoptera litura F. was<br />conducted at the Laboratory of Crop Protection, Indonesian<br />Legumes and Tuber Crops Research Institute (ILETRI)<br />Malang in February-September, 2006. Leaf damage and larval<br />development on resistant genotypes was recorded to measure<br />the level of resistance. It was found that the susceptibility of<br />soybeans to the common cutworm significantly varied among<br />the breeding lines. The leaf damage of IAC-100, IAC 80-596-<br />2, and W/80-2-4-20 from larval feeding were 17.67, 18.52, and<br />23.70% respectively lower than Wilis variety with 35.57% of<br />leaf damage. These breeding lines consistently possess same<br />level of resistance to S. litura. In addition, the resistant<br />breeding lines affect on biological aspects i.e. prolonged<br />duration of larval stage, reduced larval and pupae gain weight,<br />and cause significant larval mortality compared with Wilis<br />variety. The study suggested that IAC-100, IAC 80-596-2, and<br />W/80-2-4-20 could be used as a source of resistance for S.<br />litura in breeding program.</p>