HTD: A Light-Weight Holosymmetrical Transition Detector for Wide-Voltage-Range Variation Resilient ICs

Abstract

To mitigate the excess timing margin in conventional digital integrated circuit design, resilient circuits were proposed. The current techniques however either have a large error-detecting register or have difficulty in wide-voltage-range (down to near-threshold) operation. In this paper, we propose a light-weight holosymmetrical transition detector (HTD) that can work reliably at near-threshold to normal VDD with fast response time. Combined with a conventional latch, the HTD-latch is used to replace the end point flip-flop for timing error prediction with an area overhead of only 9.5% over a conventional flip-flop. Besides, we optimize the speculation window and design an adaptive duty-cycle control mechanism to reduce the short-path padding overhead in a resilient circuit. In addition, with voltage scaling, we keep the system working at the point before the first failure by using local detection and global clock gating, which needs neither architectural circuit change nor complicated error recovery mechanism. We apply the above-mentioned three techniques on an eighth-order filter test chip in a 40-nm CMOS process. The measurement results demonstrate that the proposed HTD can work robustly at 0.474–1.1 V. With 4.37% area overhead in total, the proposed resilient technique improves performance by 179.31%/28.2% and energy efficiency by 45.6%/28.1% in a near- $V_{\mathrm {TH}}$ (0.474 V)/super- $V_{\mathrm {TH}}$ (1.1 V) operation, as compared with the baseline design. Therefore, our proposed HTD-based resilient technique can improve the energy efficiency of circuits by almost eliminating all the timing margins.