One platform for all researcher needs
AI-powered academic writing assistant
Your #1 AI companion for literature search
AI tool for graphics, illustrations, and artwork
Unlock unlimited use of all AI tools with the Editage Plus membership.
Explore Editage Plus
Audio Papers
Ask R Discovery
Translation
Auto-sync
Collaboration
https://doi.org/10.1109/iedm.1985.190881
Copy DOI
Export
Save
Share
Cite Publication Date: Jan 1, 1985 |
 Citations: 29 |
This work describes a hot electron induced current gain degradation study in advanced self-aligned sidewall spacer NPN bipolar transistors. The effects of the extrinsic base drive-in thermal cycle on current gain degradation and intrinsic base link-up are discussed.
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
