Abstract
Vanadium oxide thin films were deposited on stainless steel substrates at different temperatures using the Pulsed laser deposition technique. Post annealing effect on the better crystalline V2O5 film was studied and found that the annealing had a positive impact on the crystallization. The structural and morphological properties were investigated by XRD, Raman, and SEM analysis. The presented work opens up the changes that occur in phase orientations and the tunable morphological growth in the Vanadium oxide thin films. The prepared thin films have potential applications in energy storage devices.
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