Abstract
In the present study, we have studied the low temperature power factors of (00l) oriented nanocrystalline bismuth antimony telluride thin films that were deposited by one step thermal evaporation. Structural features of the films were probed using X-ray diffraction (XRD) and Field Emission Scanning Electron Microscope (FESEM). XRD analysis revealed that the films were oriented along (00l) direction, in contrast to the films deposited at room temperature conditions. Films showed a promising seebeck coefficient (S) of −167.4 μV/K and electrical conductivity (σ) of 6.19 × 103 S/m which led to a power factor (S2σ) of 173.5 μW/mK2 at room temperature. FESEM analysis depicted that the film was composed of ‘flake’ like grains. Crystallite size corresponding to the most intense peak in XRD turned out to be 22.7 nm. Thickness of the films was found to be 135 nm from the cross sectional FESEM of the film. Elemental composition of the films was probed using Energy Dispersive X-ray spectroscopy. The electrical properties of the film were also checked at regular time interval which showed that films had a stable electrical performance.
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