Abstract
Fourier transform spectroscopy was extended to the x-ray region using an intensity correlation technique and a separate crystal design of an x-ray Michelson interferometer capable of a large path difference. A demonstration was presented measuring the bandwidth of Si 0 6 14 back diffraction as narrow as 12.8 attometers at a wavelength of 71.3 pm. Insensitivity of the resolution to the crystal perfection would open up ultrahigh-resolution spectroscopy beyond 10−9.
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