Abstract
We have developed an off-line facility for very precise characterization of the reflectance and spatial resolution of the grazing incidence Wölter type I x-ray optics used at Nova. The primary component of the facility is a new, very versatile, high brightness x-ray source consisting of a focused DC electron beam incident onto a precision manipulated target-pinhole array. The data are recorded with a selection of detectors. For imaging measurements we use direct exposure x-ray film modules or an x-ray charge-coupled device camera. For energy-resolved reflectance measurements, we use lithium drifted silicon detectors and a proportional counter. An in situ laser alignment system allows precise location and rapid periodic alignment verification of the x-ray point source, the statically mounted Wölter optic, and the chosen detector.
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