Abstract
We have conducted characterization measurements of a Wölter grazing incidence x-ray microscope. The measurements were carried out on 5% sectors of a Wölter x-ray optic in a laboratory utilizing a new, very versatile, high brightness x-ray source. Absolute reflectance measurements as a function of x-ray energy were made with Si(Li) detectors to acquire continuum spectra prior to and after reflecting off the Wölter optic. Spatial resolution characteristics of the Wölter were mapped out using backilluminated pinholes or grids imaged onto film or an x-ray charge-coupled device camera. The implications of the asymmetric point spread function are considered.
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