Harmful effects and damage to electronics by electrostatic discharges

Abstract

Electronic systems malfunctions are increasingly being attributed to electrostatic discharge effects. Owing to the growing deployment of sensitive data-processing machines in ‘static’ prone environments, such effects are creating a reputation for unreliability. The discharge of static electricity near active electronic systems can cause memory corruption or temporary failure owing to device latch-up, usually recoverable on re-start. At the device level, however, electrostatic discharges may result in total destruction. The mechanisms of such failure are discussed. Typical practical problems which arise in electronics production, test and packaging are described, combative means presented and areas of uncertainly reviewed.