Hard x-ray imaging using free-standing spherically bent crystals

Abstract

We report the attempt to prepare free-standing spherically bent Si crystals with radii of curvature as small as 30 cm and large uniform working areas up to several cm2. We also report on the use of these crystals in the Laue geometry to record two-dimensional high spatial resolution x-ray images in the hard x-ray region (λ∼0.5 Å). We discuss how these bent crystals were made, and show how these spherically bent crystals were used in the Laue geometry to obtain hard x-ray images of test objects at the silver K-alpha wavelength at two different magnifications. The mean spatial resolution of this x-ray imaging scheme, determined from the recorded image traces, was found to be better than 10 μm over a field of view of 1.5×1.5 mm. Contributions of possible focusing mechanisms (dynamical and polychromatic) are discussed. Additional theoretical understanding of how such a scheme is working is needed.