Abstract
AbstractThin films of different polymers ‐ poly(styrene) (PS), poly(methylmethacrylate) (PMMA), poly(vinylcarbazole) (PVCz), poly(vinylchloride) (PVC) and poly(vinylidene fluoride) (PVDF) ‐ were deposited by spin‐coating or by vapor deposition. On these polymers, thin films of (hexadecafluorophthalocyaninato)‐oxovanadium (F16PcVO) were prepared by physical vapor deposition. The growth of these films was monitored in situ by optical spectroscopy. The optical absorbance spectra were analyzed based on the coupling of transition dipoles to obtain information on the intermolecular arrangement of chromophores in the films. In all of these samples, the molecules are oriented with their molecular plane preferentially perpendicular to the substrate surface. This gives the desired overlap of the π‐systems for electric conductance parallel to the substrate. Differences in the interactions were detected when deposition temperatures below or above the glass transition temperature of a given polymer were compared. The morphology of the polymer films and the deposited semiconductors were investigated by atomic force microscopy and scanning electron microscopy. The influence of the chosen substrate on the film structure is determined. The optical and electric properties of the films could thereby be influenced and the applicability of such films as active layers in organic thin film transistors is discussed.
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