Abstract
AbstractTo assess the efficacy of a transmission‐type parallel plane reference chamber (T‐REF) for small‐field percentage depth dose (PDD) measurements using two high‐resolution detectors. The study utilizes microSilicon and microDiamond detectors for small‐field measurements, both with and without a T‐REF reference chamber. TrueBeam linear accelerator provides various photon energies (6X, 6XFFF, 10X, 10XFFF) for depth dose measurements. A sun‐nuclear 3D water tank is used to measure the PDD up to a depth of 15 cm. Analysis of the data includes a 1D gamma passing rate calculated using an in‐house MATLAB program. The study compares the PDD measurements obtained with and without the T‐REF. The T‐REF exhibits negligible beam perturbations across different field sizes and energies. The overall maximum mean PDD differences are 0.31 ± 0.16% for microSilicon and 0.33 ± 0.17% for microdiamond. The overall mean 1D gamma passing rate is 99.6 ± 0.2%. This study demonstrates that the T‐REF is a reliable and effective reference detector for small‐field radiation dosimetry.
Published Version
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