Abstract
By introducing an epitaxial Cr(00l) buffer layer, single-crystal Fe(001)/Cr(001) superlattices having extremely flat interfaces were grown on MgO(001) substrates by molecular beam epitaxy. Sharp reflection high-energy electron diffraction patterns and low resistivity at 5 K show that the Fe/Cr superlattice has the highest quality of the interfaces among those so far reported. Results indicate that the interface roughness influences the magnitude of both residual resistivity and magnetoresistance.
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