Growth mechanism and domain structure study on epitaxial BiFeO3 film grown on (La0.3Sr0.7)(Al0.65Ta0.35)O3

Abstract

A BiFeO3 (BFO) film is epitaxially grown on an (La0.3Sr0.7)(Al0.65Ta0.35)O3 (LSAT) substrate to investigate the lattice mismatch effect on the domain structure and lattice strain status within the BFO film. Atomic resolution scanning transmission electron microscope image, selected area electron diffraction (SAED) patterns, and X-ray reciprocal space mapping (XRSM) data clearly reveal that the lattice strain originating from the lattice mismatch between BFO and LSAT is relaxed by causing misfit dislocations in the BFO film. The SAED and XRSM data indicate that the crystal structure of BFO film is rhombohedral with the space group R3c. In particular, XRSM data acquired along two different in-plane orientations reveal that the BFO layer consists of two different domains that were 90° off each other with respect to the surface normal orientation. An atomistic model based on the crystal orientation relation found by SAED and XRSM shows that (1) the ferroelectric polarization axes of both domains are 35.6° with respect to the BFO film surface and (2) the two domains are consistent with the so-called 71° (and/or 109°) ferroelectric domains reported previously. The lattice mismatch of ∼2.8% calculated based on the epitaxial relation is proposed to be too large to be stored as elastic strain energy within the BFO layer.