Abstract
The growth behavior and surface morphology of a rough film system, deposited on silicone oil drop surfaces by a r.f. magnetron sputtering method, have been studied. An anomalous film growth relaxation is observed during the deposition process. The relaxation rate is extremely sensitive to the substrate temperature. The surface morphology at the micrometer length scale is very susceptible to the substrate temperature, the incident r.f. capacity, and the nature of the solid substrate on which the oil drop is dripped. A discussion on the physical origins of these phenomena is also presented.
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