Abstract
Gate Oxide Thickness and Drain Current Variation of Dual Gate Tunnel Field Effect Transistor
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https://doi.org/10.5829/ije.2024.37.03c.09
Copy DOIJournal: International Journal of Engineering | Publication Date: Jan 1, 2024 |
Citations: 2 | License type: cc-by |
Gate Oxide Thickness and Drain Current Variation of Dual Gate Tunnel Field Effect Transistor
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