GaN PMIC Opportunities: Characterization of Analog and Digital Building Blocks in a 650V GaN-on-Si Platform

Abstract

This paper reports the performance of GaN -based building blocks for monolithic integration. An integrated gate driver, low-voltage analog and synchronous digital circuits are fabricated in a 650-V GaN-on-Si process and measured. Calibrated GaN models are compared against simulated silicon designs to identify optimal integration criteria.