Abstract
Frequency dependence of critical current density (Jc) for YBa2Cu3O7-X (YBCO) thin films was investigated. YBCO thin films were prepared on MgO substrates by the KrF excimer pulsed laser deposition method. Frequency characteristics of Jc for these films were studied by measuring the I–V characteristics. It was found that the temperature dependence of Jc follows the SIS (S: superconductor, I: insulator) model at low frequency range and the SNS (N: normal conductor) junction model at high frequency range. The nonsuperconducting material of the junctions dominates the Jc-T characteristics, and the Jc decreases when operating frequency increases.
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