Abstract
This contribution deals with the formative time lags in coaxial test gaps stressed with very steep voltage pulses. The investigations were performed for different electrode arrangements and SF6-N2 gas mixtures with varying mixture ratio. It was demonstrated that small admixtures of SF6 (25%) to N2 cause a nearly identical voltage time characteristic compared with pure SF6. The influence of the degree of homogeneity upon the voltage time characteristic of SF6-N2-mixtures is rather small.
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