Abstract
ON-chip electrical overstress (EOS) and electrostatic discharge (ESD) protection is continuing to attract considerable attention as these phenomena are still within the top five of major causes for semiconductor integrated circuit yield losses. From the 1997 EOS/ESD Symposium, sponsored by the ESD Association in cooperation with and the IEEE, September 1997, Santa Clara, CA, we have chosen four papers to be published in this issue.
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