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https://doi.org/10.31399/asm.edfa.2000-4.p010
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Cite Journal: EDFA Technical Articles |  Publication Date: Nov 1, 2000 |
Affiliation: National Space Agency
Abstract High-frequency devices such as monolithic microwave ICs (MMICs) are used in telecommunication devices as well as in satellites for earth imaging and radar applications. This article discusses the use of focused ion beam (FIB) cross sectioning and sample decoration techniques for analyzing MMICs and III-V materials.
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