Abstract
Spontaneous fluctuations and stimulus response are essential features of neural functioning, but how they are connected is poorly understood. I derive fluctuation-dissipation relations (FDR) between the spontaneous spike and voltage correlations and the firing rate susceptibility for (i)the leaky integrate-and-fire (IF) model with white noise and (ii)an IF model with arbitrary voltage dependence, an adaptation current, and correlated noise. The FDRs can be used to derive thus far unknown statistics analytically [model (i)] or the otherwise inaccessible intrinsic noise statistics [model (ii)].
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