Abstract
Far-infrared reflectivity measurements have been made on eight molecular-beam epitaxy (MBE)-grown HgTe–CdTe superlattices from two sources. The spectra at 300, 77, and 6 K display the phonon modes of pure HgTe, pure CdTe, and alloy Hg1−xCdxTe . Analysis shows that two of these microstructures contain layers of pure HgTe and CdTe separated by abrupt or graded alloy interfaces, whereas the others are more nearly HgTe–Hg1−xCdxTe structures with x=0.65 to 0.90. Details of the alloy models are discussed. Our analysis appears to be a first test of long-wavelength superlattice dielectric response theory.
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