Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs

Abstract

Space applications using SRAM-based FPGA devices demand an accurate evaluation of high-energy radiation particle effects on the design functionality even when mitigation techniques are adopted. In this work, we evaluated the failure rate of different layout solutions of redundancy-based radiation tolerant design. Experimental results achieved thanks to fault injection campaigns and proton radiation tests on different radiation tolerant design implementations demonstrate that an isolation-based redundancy layout provides more than one order of magnitude radiation tolerance capabilities than a commercial solution.