Abstract
Herein, the combined impact of ion beam milling and postannealing treatment on the transport properties of deposited YBa2Cu3Ox (YBCO) thin film and fabricated step‐edge Josephson junction (JJ) on degraded MgO (100) substrates are investigated, and the obtained results of the YBCO thin film and fabricated step‐edge JJ on treated MgO (100) substrate are compared with the YBCO film and step‐edge junction on a fresh MgO substrate. Structural study reveals the formation of c‐axis‐oriented YBCO thin film on revived MgO substrate which is very much comparable with the YBCO film on fresh substrate. Atomic force microscopy (AFM) technique is used to confirm the step heights of the fabricated step‐edges on fresh, revived, and degraded MgO substrates. After the treatment, the surface roughness of MgO substrate has reduced from 56 to 1.06 nm which is comparable with the fresh MgO (100) substrate. The acquired values of critical temperatures for as‐deposited YBCO thin film on fresh and revived MgO substrates are 89.1 and 88.3 K, respectively, whereas these values are 85.8 and 85.7 K for the fabricated step‐edge junction microbridges on these deposited thin films. For both the fabricated step‐edge junction on the revived and fresh MgO substrate, the superconductor–normal metal–superconductor‐type JJ is confirmed.
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