Abstract
SynopsisAn extended reverse Monte Carlo (RMC) method for obtaining optical constants of ultrathin films and solids is presented. Our results show that this method works very well in extracting some exquisite information from experimentally measured reflection electron energy loss spectroscopy (REELS) spectra. The energy loss function (ELF) of 100 nm nickel film in a relatively larger energy loss range of 0-200 eV has been obtained, which agrees well with other computational data. Employing this ELF, individual contributions to REELS intensity due to surface and bulk plasmon excitations are quantitatively separated for further study.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
